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Unevenness detector - List of Manufacturers, Suppliers, Companies and Products

Unevenness detector Product List

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3-axis unevenness detector KW13Trio KW33Trio

The 3-axis unevenness detector KW13Trio and KW33Trio are high-precision unevenness defect detectors.

◆ Individually detects irregularities, allowing for a more detailed understanding of the surface texture. ◆ Composed of a cast body, it has high heat and gas resistance, making it suitable for harsh measurement environments. ◆ The protection shield reduces malfunctions caused by light and dust interference. ◆ Displays the length of defective detection points using a proximity switch.

  • Other measurement, recording and measuring instruments

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Can detect paint defects larger than 1mm! High-precision micro unevenness detection device.

Inspection of the important theme in the painting process, 'paint defects,' is now possible! The detection location is clear at a glance with a high-precision micro-roughness detection device!

The micro surface roughness detection device "Sphirna" HIU-SP800 detects minute irregularities that are difficult to detect with conventional technology using the newly developed PH method (Pixel Histogram). Utilizing the principle of light leverage, it enables high-precision measurement compared to pattern projection type 3D measurement devices. For more details, please download the catalog or contact us. 【Features】 ○ Detects micro irregularities of Φ1mm or larger. ○ Detection results can be overlaid with images of the object, making the detection position clear at a glance. ○ Capable of measuring the tilt of the object's surface.

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High-precision micro-roughness detection device compatible with extensive measurements using collaborative robots.

Detecting the important theme of the painting process, "paint defects"! A high-precision micro-roughness detection device! Automating the inspection process to achieve cost reduction and further enhance quality and reliability!

The micro surface roughness detection device "Sphirna" HIU-SP800 detects minute irregularities that are difficult to detect with conventional technology using a newly developed PH method (Pixel Histogram). Utilizing the principle of light leverage, it allows for high-precision measurement compared to pattern projection type 3D measurement devices. Furthermore, it employs a collaborative robot for multi-joint operations, enabling inspection alongside operators. By adopting this device, the inspection process can be automated, reducing costs while achieving higher quality and reliability. For more details, please download the catalog or contact us. 【Features】 ○ Detects micro irregularities of 1mm or more. ○ Detection results can be overlaid with images of the object, making the detection position clear at a glance. ○ Measurement of the tilt of the object's surface is also possible.

  • Other inspection equipment and devices

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